A direct micropipette-based calibration method for atomic force microscope cantilevers
نویسندگان
چکیده
منابع مشابه
Calibration of rectangular atomic force microscope cantilevers
A method to determine the spring constant of a rectangular atomic force microscope cantilever is proposed that relies solely on the measurement of the resonant frequency and quality factor of the cantilever in fluid ~typically air!, and knowledge of its plan view dimensions. This method gives very good accuracy and improves upon the previous formulation by Sader et al. @Rev. Sci. Instrum. 66, 3...
متن کاملCalibration of atomic force microscope cantilevers using piezolevers.
The atomic force microscope (AFM) can provide qualitative information by numerous imaging modes, but it can also provide quantitative information when calibrated cantilevers are used. In this article a new technique is demonstrated to calibrate AFM cantilevers using a reference piezolever. Experiments are performed on 13 different commercially available cantilevers. The stiff cantilevers, whose...
متن کاملGDQEM Analysis for Free Vibration of V-shaped Atomic Force Microscope Cantilevers
V-shaped and triangular cantilevers are widely employed in atomic force microscope (AFM) imaging techniques due to their stability. For the design of vibration control systems of AFM cantilevers which utilize patched piezo actuators, obtaining an accurate system model is indispensable prior to acquiring the information related to natural modes. A general differential quadrature element method (...
متن کاملNote: Improved calibration of atomic force microscope cantilevers using multiple reference cantilevers.
Overall precision of the simplified calibration method in J. E. Sader et al., Rev. Sci. Instrum. 83, 103705 (2012), Sec. III D, is dominated by the spring constant of the reference cantilever. The question arises: How does one take measurements from multiple reference cantilevers, and combine these results, to improve uncertainty of the reference cantilever's spring constant and hence the overa...
متن کاملAn analytic model for accurate spring constant calibration of rectangular atomic force microscope cantilevers
Spring constant calibration of the atomic force microscope (AFM) cantilever is of fundamental importance for quantifying the force between the AFM cantilever tip and the sample. The calibration within the framework of thin plate theory undoubtedly has a higher accuracy and broader scope than that within the well-established beam theory. However, thin plate theory-based accurate analytic determi...
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ژورنال
عنوان ژورنال: Review of Scientific Instruments
سال: 2009
ISSN: 0034-6748,1089-7623
DOI: 10.1063/1.3152220